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Author: Jay Gohil

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Next-Gen Low-Power SRAM Design Using 12T FinFET Bit-Cell Architecture
  • Written by: Jay Gohil
  • April 28, 2025
ASIC

Next-Gen Low-Power SRAM Design Using 12T FinFET Bit-Cell Architecture

introduction In the current age of compact and energy-efficient devices such as smartwatches, IoT sensors, and mobile phones, the demand for low-power memory solutions has

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  • Improving At-Speed Test Coverage without Compromising Test Time and Reducing Test Cost in Multi-Partition SCAN Design
    May 12, 2025
    Improving At-Speed Test Coverage without Compromising Test Time and Reducing Test Cost in Multi-Partition SCAN Design
  • Next-Gen Low-Power SRAM Design Using 12T FinFET Bit-Cell Architecture
    April 28, 2025
    Next-Gen Low-Power SRAM Design Using 12T FinFET Bit-Cell Architecture
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Improving At-Speed Test Coverage without Compromising Test Time and Reducing Test Cost in Multi-Partition SCAN Design
  • 12 May, 2025
Improving At-Speed Test Coverage without Compromising Test Time and Reducing Test Cost in Multi-Partition SCAN Design
Next-Gen Low-Power SRAM Design Using 12T FinFET Bit-Cell Architecture
  • 28 Apr, 2025
Next-Gen Low-Power SRAM Design Using 12T FinFET Bit-Cell Architecture

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