Improving At-Speed Test Coverage without Compromising Test Time and Reducing Test Cost in Multi-Partition SCAN Design
introduction The ongoing progress in semiconductor technology has resulted in the development of highly integrated System on Chip (SoC) designs that amalgamate digital, analog, and
Next-Gen Low-Power SRAM Design Using 12T FinFET Bit-Cell Architecture
introduction In the current age of compact and energy-efficient devices such as smartwatches, IoT sensors, and mobile phones, the demand for low-power memory solutions has
